IEEE Transactions on Electron Devices
Publication date:
2022-09-01
Volume:
69
Pages:
5357 -
5362
Publisher:
Institute of Electrical and Electronics Engineers
Author:
Chen, Wen-Chieh
Chen, Shih-Hung ; Chiarella, Thomas ; Hellings, Geert ; Linten, Dimitri ; Groeseneken, Guido
Keywords:
Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Physics, Applied, Engineering, Physics, Bulk FinFET, electrostatic discharge (ESD), grounded-gate NMOS (ggNMOS), power-rail ESD clamp, transmission line pulse (TLP), very-fast transmission line pulse (vfTLP), PERFORMANCE, DEVICES, DESIGN, CLAMP, 0906 Electrical and Electronic Engineering, Applied Physics, 4009 Electronics, sensors and digital hardware