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|ITEM METADATA RECORD
|Title: ||Monitoring of neutron transmutation doped silicon recombination properties by microwave absorption transient techniques|
|Authors: ||Gaubas, Eugenijus ×|
Kraner, H. W
Vilkelis, G #
|Issue Date: ||1996 |
|Host Document: ||pages:439-449|
|Conference: ||Proceedings of the 4th International Symposium on High Purity Silicon; October 6-11, 1996; San Antonio, TX, USA.|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author|
# (joint) last author|
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