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Title: Monitoring of neutron transmutation doped silicon recombination properties by microwave absorption transient techniques
Authors: Gaubas, Eugenijus ×
Vanhellemont, Jan
Simoen, Eddy
Claeys, Cor
Clauws, P
Kraner, H. W
Vilkelis, G #
Issue Date: 1996
Host Document: pages:439-449
Conference: Proceedings of the 4th International Symposium on High Purity Silicon; October 6-11, 1996; San Antonio, TX, USA.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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