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Title: BTI reliability of advanced gate stacks for beyond silicon devices: challenges and opportunities
Authors: Groeseneken, Guido
Franco, Jacopo
Cho, Moon Ju
Kaczer, Ben
Toledano Luque, Maria
Roussel, Philippe
Kauerauf, Thomas
Alian, AliReza
Mitard, Jerome
Arimura, Hiroaki
Lin, Dennis
Waldron, Niamh
Sioncke, Sonja
Witters, Liesbeth
Mertens, Hans
Ragnarsson, Lars-Ake
Heyns, Marc
Collaert, Nadine
Thean, Aaron
Steegen, An
Issue Date: Dec-2014
Host Document: International Electron Device Meeting - IEDM pages:828-831
Conference: International Electron Device Meeting - IEDM location:San Francisco, CA USA date:2014-12-15
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Supporting Services Campusmanagement Science, Engineering and Technology

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