Workshop on metrological Atomic, Location: Trappes, Paris
Publication date:
2011-08-01
Publisher:
LNE; Trappes
Workshop on metrological atomic force microscope instrumentation
Author:
Piot, Jan
Qian, Jun ; Pirée, Hugo ; Kotte, Gerard ; Pétry, Jasmine ; Kruth, Jean-Pierre ; Vanherck, Paul ; Van Haesendonck, Chris ; Reynaerts, Dominiek
Keywords:
Nanometrology, Atomic force microscope