Title: Positive and negative bias temperature instability on La2O3 and Al2O3 capped high-k MOSFETs
Authors: Aoulaiche, Marc
Kaczer, Ben
Cho, Moonju
Houssa, Michel
Degraeve, Robin
Kauerauf, Thomas
Akheyar, Amel
Schram, Tom
Roussel, Philippe
Maes, Herman
Hoffmann, Thomas
Biesemans, Serge
Groeseneken, Guido #
Issue Date: 2009
Publisher: IEEE
Conference: International Reliability Physics Symposium edition:2009 location:Monreal, Canada date:April 2009
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Semiconductor Physics Section
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
# (joint) last author

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