This item still needs to be validated !
ITEM METADATA RECORD
Title: Atomic force microscopy: a powerful tool to study the radial gradients in mechanical properties of hard-drawn pearlitic steel wire
Authors: Delrue, H
Bruneel, E
Van Humbeeck, Jan
Aernoudt, Etienne #
Issue Date: 2000
Host Document: Proc. WCTS, Wire & Cable Technical Symposium, 70th Annual Convention pages:5-11
Conference: location:Nashville, Tennessee, USA date:2000
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Physical Metallurgy and Materials Engineering Section (-)
Department of Materials Engineering - miscellaneous
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy

 




All items in Lirias are protected by copyright, with all rights reserved.