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Title: Atomic force microscopy: a powerful tool to study the radial gradients in mechanical properties of hard-drawn pearlitic steel wire
Authors: Delrue, H
Bruneel, E
Van Humbeeck, Jan
Aernoudt, Etienne #
Issue Date: 2000
Host Document: Proc. WCTS, Wire & Cable Technical Symposium, 70th Annual Convention pages:5-11
Conference: location:Nashville, Tennessee, USA date:2000
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Physical Metallurgy and Materials Engineering Section (-)
Department of Materials Engineering - miscellaneous
# (joint) last author

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