Proc. WCTS, Wire & Cable Technical Symposium, 70th Annual Convention
Publication date:
2000-01-01
11
Author:
Delrue, H
Bruneel, E ; Van Humbeeck, Jan ; Aernoudt, Etienne
Abstract:
Atomic force microscopy (AFM) was applied to study the nano-scale lamellar microstructure of heavily deformed pearlitic steel wire used in automotive applications. In combination with high-resolution scanning electron microscopy and mechanical testing, the influence of the process parameters on radial gradients in the wire properties was characterized. Furthermore, a quantitative determination of the cross-sectional variation of the interlamellar distances is made with AFM and linked to the gradients in mechanical properties determined in tension and torsion.