Microelectronics Reliability
Publication date:
2021-07-01
Volume:
122
Publisher:
Elsevier
Author:
Tyaginov, S
Makarov, A ; Chasin, A ; Bury, E ; Vandemaele, M ; Jech, M ; Grill, A ; De Keersgieter, A ; Linten, D ; Kaczer, B
Keywords:
Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Nanoscience & Nanotechnology, Physics, Applied, Engineering, Science & Technology - Other Topics, Physics, Hot-carrier degradation, Self-heating, Transport, Interface states, NWFET, Modeling, DISSOCIATION KINETICS, GENERATION, DEVICE, PASSIVATION, TRANSISTORS, SCATTERING, MECHANISM, TRANSPORT, DEFECTS, NMOS, 0906 Electrical and Electronic Engineering, Applied Physics, 4009 Electronics, sensors and digital hardware