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Keywords:

Science & Technology, Technology, Materials Science, Multidisciplinary, Materials Science, 2D capacitance, MX2 capacitor model, channel resistance, Dit, MoS2, interface defects, edge MOS capacitor, VOLTAGE MODEL, TRAP DENSITY, TRANSISTORS, EXTRACTION, C14/17/080#54271200, 0303 Macromolecular and Materials Chemistry, 0912 Materials Engineering, 1007 Nanotechnology, 4016 Materials engineering, 4018 Nanotechnology, 5104 Condensed matter physics