Proceedings of the International Workshop on Semiconductor devices, Date: 2001/12/11 - 2001/12/15, Location: Singapore
PROCEEDINGS OF THE ELEVENTH INTERNATIONAL WORKSHOP ON THE PHYSICS OF SEMICONDUCTOR DEVICES, VOL 1 & 2
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Keywords:
Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Instruments & Instrumentation, Optics, Physics, Condensed Matter, Engineering, Physics, 4006 Communications engineering, 4009 Electronics, sensors and digital hardware, 5102 Atomic, molecular and optical physics
Abstract:
The ESD reliability issues in conventional ESD protection circuit elements in CMOS technology are investigated. Due to the stringent load limitations, the success of implementing a robust ESD protection depends on careful selection, design and layout of the devices. Further, at frequencies above 2.5GHz, the design window for application of most of these devices rapidly deteriorates. This paper highlights the benefits and limitations of the standard ESD protection methodologies.