Conference on Optical and Infrared Interferometry and Imaging VIII Part of SPIE Astronomical Telescopes and Instrumentation Conference, Date: 2022/07/17 - 2022/07/22, Location: CANADA, Montreal
Publication date:
2022-01-01
Volume:
12183
ISSN:
978-1-5106-5347-4
DOI:
10.1117/12.2628268
Publisher:
Society of Photo-optical Instrumentation Engineers
OPTICAL AND INFRARED INTERFEROMETRY AND IMAGING VIII
Author:
Lanthermann, Cyprien
Ten Brummelaar, Theo ; Tuthill, Peter ; Martinod, Marc-Antoine ; Ligon, E Robert ; Gies, Douglas ; Schaefer, Gail ; Anderson, Matthew ; Merand, A ; Sallum, S ; Sanchez-Bermudez, J
Keywords:
Science & Technology, Physical Sciences, Technology, Astronomy & Astrophysics, Instruments & Instrumentation, Optics, e-APD, sensitivity, optical interferometry, near-infrared, K-band, H-band, SUPERMASSIVE BLACK-HOLES, ANGULAR DIAMETERS, BINARY, 4006 Communications engineering, 4009 Electronics, sensors and digital hardware, 5102 Atomic, molecular and optical physics