Title: A new software package for interpreting electron diffraction contrast images of arbitrary displacement fields: SIMCON
Authors: Janssens, K G ×
Vanhellemont, J
Van der Biest, Omer #
Issue Date: Jul-1993
Publisher: Wiley-liss
Series Title: Microscopy research and technique vol:25 issue:2 pages:171-172
ISSN: 1059-910X
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Physical Metallurgy and Materials Engineering Section (-)
× corresponding author
# (joint) last author

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