A versatile modular program (SIMCON) for the simulation of electron diffraction contrast images of localized displacement fields resulting from elastic stress concentrations on a submicron scale has been developed. A first module computes the displacement field. Analytical as well as finite-element calculations with existing software are possible. The second module calculates the contrast image based on full two-beam dynamical diffraction theory using the displacement field as computed by the first. The third module can be used to perform image-analysis operations on the calculated intensity distribution and subsequently viewing the result on a computer screen or making hard copies on a PostScript printer. We present some examples of simulations under two-beam diffraction conditions illustrating the power of SIMCON.