Title: Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance
Authors: Hopman, W. C. L ×
Hollink, A. J. F
de Ridder, R. M
van der Werf, K. O
Subramaniam, V
Bogaerts, Walter #
Issue Date: Sep-2006
Publisher: Optical soc amer
Series Title: Optics express vol:14 issue:19 pages:8745-8752
Abstract: We show that nano-mechanical interaction using atomic force microscopy (AFM) can be used to map out mode-patterns of an optical micro-resonator with high spatial accuracy. Furthermore we demonstrate how the Q-factor and center wavelength of such resonances can be sensitively modified by both horizontal and vertical displacement of an AFM tip consisting of either Si3N4 or Si material. With a silicon tip we are able to tune the resonance wavelength by 2.3 nm, and to set Q between values of 615 and zero, by expedient positioning of the AFM tip. We find full on/off switching for less than 100 nm vertical, and for 500 nm lateral displacement at the strongest resonance antinode locations. (c) 2006 Optical Society of America
ISSN: 1094-4087
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Centre for Nuclear Engineering
× corresponding author
# (joint) last author

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