Journal of the European Ceramic Society vol:18 issue:11 pages:1565-1570
In this paper, we use high-resolution transmission electron microscopy and electron energy-loss spectroscopy to study the microstructure of grain boundaries and the segregation of yttrium, respectively, in yttria-stabilized tetragonal polycrystalline zirconia, sintered from different high-purity powders. No amorphous films were observed at the grain boundaries, and only the sample containing the highest amount of silicon impurity showed presence of an amorphous silicate phase in all triple grain junctions. A strong yrtrium segregation to the grain boundaries is observed in all samples, despite different grain sizes and impurity levels. (C) 1998 Elsevier Science Limited. All rights reserved.