Title: Degradation of tunnel-oxide floating-gate eeprom devices and the correlation with high field-current-induced degradation of thin gate oxides
Authors: Witters, Js ×
Groeseneken, Guido
Maes, He #
Issue Date: Sep-1989
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Transactions on electron devices vol:36 issue:9 pages:1663-1682
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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