Title: Design and assessment of a circuit and layout level radiation hardened CMOS VCSEL driver
Authors: Leroux, Paul ×
Lens, Steven
Voorspoels, Reinhard
Van Uffelen, Marco
De Cock, Wouter
Steyaert, Michel
Berghmans, Francis #
Issue Date: Aug-2007
Publisher: Professional Technical Group on Nuclear Science
Series Title: IEEE Transactions on Nuclear Science vol:54 issue:4 pages:1055-1060
Abstract: The radiation hard design of a 155 Mb/s, 0.7 mu m CMOS driver for a vertical-cavity surface-emitting laser (VCSEL) is presented. The circuit features enhanced tolerance to radiation induced shifts in the device characteristics by employing a replica-based feedback mechanism. The layout was achieved using an in-house developed radiation hardened component library. At a low dose rate of 4.5 Gy/h or 450 rad/h, the output current remains constant up to at least 3.5 kGy. At a dose rate of 21 kGy/h, the output current of the driver drops by 10% at a dose of 3.5 MGy and breaks down completely at 5.5 MGy.
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
Technologiecluster ESAT Elektrotechnische Engineering
Electrical Engineering (ESAT) TC, Technology Campus Geel
× corresponding author
# (joint) last author

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