Author:

Keywords:

Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Physics, Applied, Physics, Condensed Matter, Engineering, Physics, 0204 Condensed Matter Physics, 0205 Optical Physics, 0906 Electrical and Electronic Engineering, Applied Physics, 4009 Electronics, sensors and digital hardware, 5104 Condensed matter physics

Abstract:

The base resistance model proposed by Hauser has been widely used to model the distributed nature of the emitter-base junction. One of the advantages of this model is the implicit modeling of the current crowding effect. However, the current crowding effect violates the assumption of uniform base sheet resistivity on which the calculation of Hauser is based, due to the bias and current dependence of the base sheet resistivity. In this text, it will be shown how the model of Hauser is affected by the non-uniformity of the base sheet resistivity caused by the current crowding effect.