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Title: Modeling the nonuniformity of base sheet resistivity at high currents in bipolar-transistors
Authors: Decoutere, S ×
Deferm, L
Claeys, Corneel
Declerck, Gilbert #
Issue Date: May-1992
Publisher: Pergamon-elsevier science ltd
Series Title: Solid-state electronics vol:35 issue:5 pages:651-653
Abstract: The base resistance model proposed by Hauser has been widely used to model the distributed nature of the emitter-base junction. One of the advantages of this model is the implicit modeling of the current crowding effect. However, the current crowding effect violates the assumption of uniform base sheet resistivity on which the calculation of Hauser is based, due to the bias and current dependence of the base sheet resistivity. In this text, it will be shown how the model of Hauser is affected by the non-uniformity of the base sheet resistivity caused by the current crowding effect.
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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