Title: Temperature-dependence of the channel hot-carrier degradation of n-channel mosfets
Authors: Heremans, Paul ×
Vandenbosch, G
Bellens, R
Groeseneken, Guido
Maes, He #
Issue Date: Apr-1990
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Transactions on electron devices vol:37 issue:4 pages:980-993
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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