Title: Model for hysteresis and kink behavior of mos-transistors operating at 4.2-k
Authors: Dierickx, B ×
Warmerdam, L
Simoen, E
Vermeiren, J
Claeys, Corneel #
Issue Date: Jul-1988
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Transactions on electron devices vol:35 issue:7 pages:1120-1125
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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