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Title: Optimal fault detection for analogue circuits under manufacturing tolerances
Authors: Gielen, Georges ×
Wang, Z
Sansen, Willy #
Issue Date: Jan-1996
Publisher: Iee-inst elec eng
Series Title: Electronics Letters vol:32 issue:1 pages:33-34
Abstract: An optimal method for analogue fault detection is presented. Instead of using arbitrary decision windows, the method fully considers the VLSI manufacturing tolerances and mismatches to minimise the probability of erroneous test decision. A-priori simulated probability information is combined with the actual measurement data to decide whether the circuit is fault-free or faulty. Experimental results show the effectiveness of the proposed technique.
URI: 
ISSN: 0013-5194
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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