|ITEM METADATA RECORD
|Title: ||High-resolution frequency-domain reflectometry|
|Authors: ||Van hamme, Hugo # ×|
|Issue Date: ||Apr-1990 |
|Publisher: ||Ieee-inst electrical electronics engineers inc|
|Series Title: ||IEEE Transactions on Instrumentation and Measurement vol:39 issue:2 pages:369-375|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||ESAT - PSI, Processing Speech and Images|
× corresponding author|
# (joint) last author|
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