Title: A simulation analysis of FIBL in decananometer Double-Gate MOSFETs with high-kappa gate dielectrics
Authors: Autran, JL ×
Munteanu, D
Bescond, M
Houssa, Michel
Said, A #
Issue Date: Jul-2005
Publisher: North-Holland
Series Title: Journal of non-Crystalline Solids vol:351 issue:21-23 pages:1897-1901
Abstract: In this work, the degradation of electrical performances of Double-Gate MOSFET due to the fringing induced barrier lowering (FIBL) effect induced by high-kappa gate dielectrics is investigated using a two-dimensional quantum-mechanical simulation code. Our numerical results show that all electrical parameters, such as the threshold voltage (V-T), device immunity to short-channel effects, off-state current (I-off), and subthreshold slope (S) are degraded when kappa increases (3.9 < kappa < 100). This degradation is both function of the channel length and the gate dielectric stack composition (number of layers, kappa value). In particular, it is shown that the introduction of a thin (< 1 nm thick) interfacial oxide layer can reduce or even completely suppress the FIBL for a given equivalent oxide thickness of the gate dielectric stack. (c) 2005 Elsevier B.V. All rights reserved.
ISSN: 0022-3093
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Semiconductor Physics Section
× corresponding author
# (joint) last author

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