Title: Evaluation of channel hot carrier effects in n-mos transistors at 77-k with the charge pumping technique
Authors: Heremans, Paul ×
Sun, Yc
Groeseneken, Guido
Maes, He #
Issue Date: Oct-1987
Publisher: Elsevier science bv
Series Title: Applied surface science vol:30 issue:1-4 pages:313-318
ISSN: 0169-4332
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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