Title: On the channel-length dependence of the hot-carrier degradation of n-channel mosfets
Authors: Bellens, R ×
Heremans, Paul
Groeseneken, Guido
Maes, He #
Issue Date: Dec-1989
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Electron Device Letters vol:10 issue:12 pages:553-555
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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