Title: Measurement of frequency response functions using periodic excitations, corrupted by correlated input/output errors
Authors: Pintelon, R ×
Schoukens, Joannes #
Issue Date: Dec-2001
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Transactions on Instrumentation and Measurement vol:50 issue:6 pages:1753-1760
Abstract: The frequency response function (FRF) of a system is often measured by taking the ratio of the output to the input Fourier coefficients of the steady-state response of the system to a periodic excitation. Generator noise, common noise disturbances picked up by the acquisition channels of the measurement device, and an external feedback loop, cause a correlation between the input/output errors of such an FRF measurement. This paper quantifies the bias error and the variance of the FRF measurement due to correlated input/output errors.
ISSN: 0018-9456
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - STADIUS, Stadius Centre for Dynamical Systems, Signal Processing and Data Analytics
× corresponding author
# (joint) last author

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