Title: Consistent model for the hot-carrier degradation in n-channel and p-channel mosfets
Authors: Heremans, Paul ×
Bellens, R
Groeseneken, Guido
Maes, He #
Issue Date: Dec-1988
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Transactions on electron devices vol:35 issue:12 pages:2194-2209
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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