Title: Analysis of hot carrier degradation in ac stressed n-channel mos-transistors using the charge pumping technique
Authors: Bellens, R ×
Heremans, Paul
Groeseneken, Guido
Maes, He #
Issue Date: Sep-1988
Publisher: Editions physique
Series Title: Journal de physique vol:49 issue:C-4 pages:651-655
ISSN: 0302-0738
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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