Title: A model for the breakdown characteristics of p-channel mos-transistor protection devices
Authors: Maes, Herman ×
Six, P
Sansen, Willy #
Issue Date: 1981
Publisher: Pergamon-elsevier science ltd
Series Title: Solid-state electronics vol:24 issue:6 pages:523-531
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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