Title: High-resolution frequency-domain reflectometry by estimation of modulated superimposed complex sinusoids
Authors: Van hamme, Hugo # ×
Issue Date: Dec-1992
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Transactions on Instrumentation and Measurement vol:41 issue:6 pages:762-767
Abstract: By assuming a parametric model for a linear one-port or two-port, the time-domain resolution of a vector network analyzer can be significantly improved with respect to the Rayleigh limit. The measurement problem is formulated as a nonlinear least squares parameter estimation problem involving the extremization of a cost function. An extremization algorithm with good global convergence properties is presented for the case of discontinuities of small reflectivity modeled as simple lumped Frequency-Dependent elements. The reflection coefficient at either port of the DUT is modeled as a superposition of Modulated complex sinusoids. Through optimization of a sequence of cost functions, the algorithm produces a sequence of fits for models that incorporate an increasing number of discontinuities.
ISSN: 0018-9456
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - PSI, Processing Speech and Images
× corresponding author
# (joint) last author

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