Title: Metal streak artifacts in X-ray computed tomography: A simulation study
Authors: De Man, Bruno ×
Nuyts, Johan
Dupont, Patrick
Marchal, Guy
Suetens, Paul #
Issue Date: Jun-1999
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Transactions on Nuclear Science vol:46 issue:3 pages:691-696
Abstract: Metal streak artifacts are an important problem in X-ray computed tomography, A high-resolution 2D fan-beam computed tomography simulator is presented. Several potential causes of metal streak artifacts are studied using phantom measurements and simulations. Beam hardening, scatter, noise and exponential edge-gradient effect are identified as important causes of metal streak artifacts. Furthermore, also aliasing effects and object motion can be responsible for certain metal streak artifacts.
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Nuclear Medicine & Molecular Imaging
ESAT - PSI, Processing Speech and Images
Research Group Experimental Neurology
Laboratory for Cognitive Neurology
× corresponding author
# (joint) last author

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