Title: Graphical technique to determine density of surface states at si-sio2 interface of mos devices using quasistatic c-v method
Authors: Declerck, Gilbert ×
Broux, G #
Issue Date: 1973
Publisher: Electrochemical soc inc
Series Title: Journal of the electrochemical society vol:120 issue:12 pages:1785-1787
ISSN: 0013-4651
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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