Title: Transconductance degradation and its correlation to the 2nd substrate current hump of submicron nmos ldd transistors
Authors: Gutierrez, Ea ×
Deferm, L
Declerck, Gilbert #
Issue Date: Oct-1991
Publisher: Elsevier science bv
Series Title: Microelectronic Engineering vol:15 issue:1-4 pages:449-452
Abstract: An extra degradation of the transconductance is observed in NMOS LDD devices which show the second substrate current hump [1]. In this paper the second substrate current hump is analysed and it is shown that the transconductance degradation is directly related to the lateral electric field at the source side.
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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