Title: Understanding of the hot carrier degradation behavior of mosfets by means of the charge pumping technique
Authors: Maes, He ×
Groeseneken, Guido
Heremans, Paul
Bellens, R #
Issue Date: Oct-1989
Publisher: Elsevier science bv
Series Title: Applied surface science vol:39 issue:1-4 pages:523-534
ISSN: 0169-4332
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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