Title: Double snapback in soi nmosfets and its application for soi esd protection
Authors: Verhaege, K ×
Groeseneken, Guido
Colinge, Jp
Maes, He #
Issue Date: Jul-1993
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Electron Device Letters vol:14 issue:7 pages:326-328
Abstract: This paper reports on a newly discovered phenomenon of double snapback observed in SOI nMOSFET's. An extensive experimental analysis of this phenomenon and a tentative model are presented. It will be shown that based on this double-snapback phenomenon, perspectives are offered towards a new electrostatic discharge (ESD) protection concept for SOI technologies.
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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