Title: Investigation of drain current rts noise in small area silicon mos-transistors
Authors: Roux, O ×
Dierickx, B
Simoen, E
Claeys, Corneel
Ghibaudo, G
Brini, J #
Issue Date: Oct-1991
Publisher: Elsevier science bv
Series Title: Microelectronic Engineering vol:15 issue:1-4 pages:547-550
Abstract: An investigation of the amplitude drain current RTS fluctuations in small area silicon MOS transistors is presented. A simple theoretical model for the interpretation of the RTS amplitude variations with gate and drain voltages is proposed. The limits of application of the model are established and discussed with respect to the experimental results.
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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