Title: A critical note on histogram testing of data-acquisition channels
Authors: Schoukens, Joannes # ×
Issue Date: Aug-1995
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Transactions on Instrumentation and Measurement vol:44 issue:4 pages:860-863
Abstract: Histogram testing is used to measure the transfer characteristic of a digitizer in order to quantify and to analyze its nonlinear behavior. In this paper it is shown that this method is very insensitive to the out-of-phase components of the digitizers' response to a sine wave excitation. This can lead to an underestimate of the nonlinear behavior of the digitizer.
ISSN: 0018-9456
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - STADIUS, Stadius Centre for Dynamical Systems, Signal Processing and Data Analytics
× corresponding author
# (joint) last author

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