Title: The influence of the measurement setup on enhanced ac hot carrier degradation of mosfets
Authors: Bellens, R ×
Heremans, Paul
Groeseneken, Guido
Maes, He
Weber, W #
Issue Date: Jan-1990
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Transactions on electron devices vol:37 issue:1 pages:310-313
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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