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Title: Transient voltage overshoot in TLP testing - Real or artifact?
Authors: Tremouilles, D ×
Thijs, Steven
Roussel, Ph
Natarajan, M. I
Vassilev, V
Groeseneken, Guido #
Issue Date: Jul-2007
Publisher: Pergamon-elsevier science ltd
Series Title: Microelectronics reliability vol:47 issue:7 pages:1016-1024
Abstract: This paper investigates on the transient pulse response of the device under test, which is becoming a critical aspect in determining the ESD reliability of a variety of technology products. For the first time, the feasibility to calibrate or tune the artifacts arising out of system parasitic to 'see' the device transient response is presented in this paper with experimental data and numerical analysis. (C) 2006 Elsevier Ltd. All rights reserved.
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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