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Title: Analytical model for the current voltage characteristics of a silicon resistor at liquid-helium temperatures
Authors: Simoen, E ×
Dierickx, B
Deferm, L
Claeys, Corneel #
Issue Date: Dec-1990
Publisher: Butterworth-heinemann ltd
Series Title: Cryogenics vol:30 issue:12 pages:1152-1159
Abstract: A simple analytical model for the current - voltage behaviour of silicon resistor at liquid helium temperature (LHeT) is presented. It is derived from a more sophisticated analysis, taking account of impurity breakdown by impact ionization and of barrier-limited (BL) and space-charge-limited (SCL) current flow. As will be shown, the turn-on/turn-off hysteresis can be understood by considering the slow, 'forced' build-up of a depletion region at the injecting contact. Both material-(technology-)related parameters and measurement history determine the injection threshold of the device. This breakdown/hysteresis behaviour is also seen in the characteristics of more 'complicated' devices at LHeT and enhances parasitic phenomena in cryogenic circuitry.
URI: 
ISSN: 0011-2275
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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