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Title: An automated 3D algorithm for neo-cortical thickness measurement
Authors: Srivastava, Siddharth ×
Maes, Frederik
Vandermeulen, Dirk
Dupont, Patrick
Van Paesschen, Wim
Suetens, Paul #
Issue Date: 2003
Publisher: Springer
Series Title: Lecture notes in computer science vol:2879 pages:488-495
Conference: Sixth annual international conference on medical image computing and computer-assisted intervention - MICCAI 2003 location:Montréal, Québec, Canada date:15-18 November 2003
Abstract: A new method is presented for fully automated regional quantification of human neo-cortical thickness from 3-D MR images. The method does not require explicit extraction of the cortical surface, but instead is based on a geodesic distance transform of the binarized 3D volumetric gray matter map obtained by automated segmentation. Regional cortical thickness distributions are derived by atlas-based partitioning of the brain. Results for 64 normal controls are presented that show very good agreement with published reference values.
Description: Srivastava S., Maes F., Vandermeulen D., Dupont P., van Paesschen W., Suetens P., ''An automated 3D algorithm for neo-cortical thickness measurement'', Lecture notes in computer science, vol. 2879, pp. 488-495, 2003, Springer-Verlag (Proceedings sixth annual international conference on medical image computing and computer-assisted intervention - MICCAI 2003, November 15-18, 2003, Montréal, Québec, Canada).
ISSN: 0302-9743
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Research Group Neurophysiology
ESAT - PSI, Processing Speech and Images
Nuclear Medicine & Molecular Imaging
Research Group Experimental Neurology
Laboratory for Cognitive Neurology
Laboratory for Epilepsy Research
× corresponding author
# (joint) last author

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