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Title: Analysis of the charge pumping technique and its application for the evaluation of mosfet degradation
Authors: Heremans, Paul ×
Witters, Jozef
Groeseneken, Guido
Maes, He #
Issue Date: Jul-1989
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Transactions on electron devices vol:36 issue:7 pages:1318-1335
URI: 
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Semiconductor Physics Section
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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