Title: A reliable approach to charge-pumping measurements in mos-transistors
Authors: Groeseneken, Guido ×
Maes, He
Beltran, N
Dekeersmaecker, Rf #
Issue Date: 1984
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Transactions on electron devices vol:31 issue:1 pages:42-53
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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