Title: Freeze-out effects on nmos transistor characteristics at 4.2-k
Authors: Simoen, E ×
Dierickx, B
Warmerdam, L
Vermeiren, J
Claeys, Corneel #
Issue Date: Jun-1989
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Transactions on electron devices vol:36 issue:6 pages:1155-1161
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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