Title: Evaluation of hot carrier degradation of n-channel mosfets with the charge pumping technique
Authors: Heremans, Paul ×
Maes, He
Saks, N #
Issue Date: Jul-1986
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Electron Device Letters vol:7 issue:7 pages:428-430
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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