Title: Static nonlinearity testing of digital-to-analog converters
Authors: Vargha, B ×
Schoukens, Joannes
Rolain, Y #
Issue Date: Oct-2001
Publisher: Ieee-inst electrical electronics engineers inc
Series Title: IEEE Transactions on Instrumentation and Measurement vol:50 issue:5 pages:1283-1288
Abstract: The paper presents a diagnostic tool for analyzing the bit intermodulations in digital-to-analog converters (DACs). Bit intermodulations cause linearity errors which degrade the performance of the converter. A better understanding of these errors can lead to designing and building more accurate converters. Therefore, a new static nonlinear model is proposed to incorporate intermodulation errors. A linear transformation of the Walsh transform of the integrated nonlinearity diagram (INL) is shown to be sufficient to extract the bit intermodulation terms and their noise sensitivity. Practical applicability of the proposed method is shown by measurements performed on a custom-designed test circuit.
ISSN: 0018-9456
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - STADIUS, Stadius Centre for Dynamical Systems, Signal Processing and Data Analytics
× corresponding author
# (joint) last author

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