Title: Interpretation of c-v measurements for determining the doping profile in semiconductors
Authors: Baccarani, G ×
Rudan, M
Spadini, G
Maes, Herman
Vandervorst, Wilfried
Vanoverstraeten, R #
Issue Date: 1980
Publisher: Pergamon-elsevier science ltd
Series Title: Solid-state electronics vol:23 issue:1 pages:65-71
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Nuclear and Radiation Physics Section
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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