IEEE Design and Test of Computers vol:10 issue:2 pages:34-44
Test algorithms for single-buffered memories are inadequate to test double-buffered memories (DBMs). This article presents test algorithms for static double-buffered RAMs and pointer-addressed memories (PAMs). To obtain a realistic fault model, the authors perform an inductive fault analysis on the DBM cells. They also show that the address generation method imposes different requirements on the test algorithms.