Title: Test algorithms for double-buffered random-access and pointer-addressed memories
Authors: Vansas, J ×
Catthoor, Francky
Deman, Hj #
Issue Date: Jun-1993
Publisher: Ieee computer soc
Series Title: IEEE Design and Test of Computers vol:10 issue:2 pages:34-44
Abstract: Test algorithms for single-buffered memories are inadequate to test double-buffered memories (DBMs). This article presents test algorithms for static double-buffered RAMs and pointer-addressed memories (PAMs). To obtain a realistic fault model, the authors perform an inductive fault analysis on the DBM cells. They also show that the address generation method imposes different requirements on the test algorithms.
ISSN: 0740-7475
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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