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Title: Testability strategy and test pattern generation for register files and customized memories
Authors: Vansas, J ×
Catthoor, Francky
Inze, L
De Man, Hugo #
Issue Date: Sep-1990
Publisher: Butterworth-heinemann ltd
Series Title: Microprocessors and microsystems vol:14 issue:7 pages:444-456
ISSN: 0141-9331
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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