Title: An accurate statistical yield model for CMOS current-steering D/A converters
Authors: Van den Bosch, Anne ×
Steyaert, Michel
Sansen, Willy #
Issue Date: Dec-2001
Publisher: Kluwer academic publ
Series Title: Analog integrated circuits and signal processing vol:29 issue:3 pages:173-180
Abstract: To obtain a high resolution CMOS current-steering digital-to-analog converter, the matching behavior of the current source transistors is one of the key issues in the design. At this moment, these matching properties are taken into account by the use of time consuming and CPU intensive Monte Carlo simulations. In this paper, a formula is derived that describes accurately the impact of the mismatch on the INL (integral non-linearity) yield of current-steering D/A converters without any loss of design time.
ISSN: 0925-1030
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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